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Next generation wireless LANs Throughput, robustness and reliability in 802.11n

By: Contributor(s): Material type: TextTextLanguage: English Publication details: New Delhi Cambridge University Prerss 2009Description: xxx, 385 p. Paper backISBN:
  • 9780521758338
Subject(s): DDC classification:
  • 004.6 PEN PEN
Item type: BOOK
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Holdings
Item type Current library Call number Copy number Status Date due Barcode Item holds
BOOK BOOK ULAB Library 004.6 PEN (Browse shelf(Opens below)) 1 Available 15264
Total holds: 0

Includes Index.

Netw-CSE

424015

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